ZEISS Axio Imager 2 for Materials Research: Precision Microscopy Solution

ZEISS Axio Imager 2 for Materials Research

Open Microscope System for Automated Material Analysis When conducting advanced materials research, introduce ease of use into your light microscopy workflow. Benefit from accurate and reproducible results using ZEISS Axio Imager 2 for materials. Choose the system tailored to your applications. Expand your instrument with dedicated solutions such as particle analysis, confocal, or correlative microscopy.

  • Reproducible results
  • Modular design
  • High optical performance

Reproducible Results​

Enjoy Vibration-Free Working Conditions​ 

Stability is essential if you want to obtain good results. Appreciate the stable imaging conditions of Axio Imager 2, especially when working with high magnifications or performing time-dependent studies. Due to the motorization of Axio Imager 2, achieve quick and reproducible results while always working under constant conditions

Modular Design​

Unlock Enhanced Versatility

In both academic and industrial research, materials microscopy encounters diverse obstacles. With Axio Imager 2, you can effectively tackle these challenges. Attach specialized components for tasks like particle analysis, explore non-metallic inclusions (NMI), liquid crystals, or semiconductor-based MEMs. Expand your instrument with tailor-made solutions for confocal or correlative microscopy.

Superior Optical Performance

Attain Exceptional Contrast and Clarity

  • Explore various materials like metals, composites, or liquid crystals with diverse contrast techniques.
  • Utilize reflected light to observe samples in brightfield, darkfield, differential interference contrast (DIC), circular differential interference contrast (C-DIC), polarization, or fluorescence.
  • Employ transmitted light to inspect samples in brightfield, darkfield, differential interference contrast (DIC), polarization, or circular polarization. The contrast manager guarantees consistent illumination settings

A Choice of Contrasting Techniques

 Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Images: courtesy of Dr. H.-L. Steyer, Kesselsdorf, Germany

Pol Cast Iron Axio Imager 2 19
C Dic Cast Iron Axio Imager 23
Darkfield Cast Iron Axio Imager 29
Pol Cast Iron Axio Imager 25
Brightfield Cast Iron Axio Imager 22

Features

Ergonomics for Your Comfort

 Axio Imager.Z2m or Axio Imager.M2m feature a touchscreen displaying essential functions, providing convenient control over all motorized components. Ergonomically placed control buttons surround the focus drive, with tactile surfaces for easy identification. Axio Imager.D2m offers five pre-programmed buttons, while Axio Imager.Z2m boasts ten user-customizable buttons. Axio Imager.A2m is encoded for added efficiency

Thermomicroscopy - Flexible Documentation of Temperature Changes

Do you want to examine how temperature influences the behavior of metals, crystals, ceramics, or plastics?

With ZEN core and Linkam heating stages, you can define heating or cooling experiments. Document the temperature pattern in a time-lapse series. The result is a log of the temperature and vacuum data in each time-lapse image. Observe sample changes during the heating or cooling process, for example, in the field of quality control

Applications

Discover more on metallographic applications

Darkfield Furniturewood Axioimager2 120
Fluorescence Carbon Fiber Axio Imager18
Polarization Anodizedalni Axioimager2 113
Transmitted Light Silicon Solar Cell Axio Imager 210
Polarization Liquidcrystalline Axioimager2 113

Documents and brochures

ZEISS Axio Imager 2
9.68 MB
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ZEISS Microscopy Solutions for Steel and Other Metals
15.7 MB
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Microscope and Measurement Systems for Quality Assurance and Quality Control
4.59 MB
DOWNLOAD

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